Authors: Ferrieu, F Ribot, P Regolini, JL

Citation: F. Ferrieu et al., Spectroscopic ellipsometry of SixGe1-x/Si: a tool for composition and profile analysis in strained heterostructures used in the microelectronics industry, THIN SOL FI, 373(1-2), 2000, pp. 211-215

Authors: Ferrieu, F

Citation: F. Ferrieu, Refined model for spectroscopic ellipsometry analysis of SixGe1-x/Si strained heterostructures, APPL PHYS L, 76(15), 2000, pp. 2023-2025