Authors:
Naik, RS
Lutsky, JJ
Reif, R
Sodini, CG
Becker, A
Fetter, L
Huggins, H
Miller, R
Pastalan, J
Rittenhouse, G
Wong, YH
Citation: Rs. Naik et al., Measurements of the bulk, C-axis electromechanical coupling constant as a function of AlN film quality, IEEE ULTRAS, 47(1), 2000, pp. 292-296