Authors: Wong-Leung, J Jagadish, C Conway, MJ Fitz Gerald, JD

Citation: J. Wong-leung et al., Effect of implant temperature on secondary defects created by MeV Sn implantation in silicon, J APPL PHYS, 89(5), 2001, pp. 2556-2559

Authors: Wong-Leung, J Fatima, S Jagadish, C Fitz Gerald, JD Chou, CT Zou, J Cockayne, DJH

Citation: J. Wong-leung et al., Transmission electron microscopy characterization of secondary defects created by MeV Si, Ge, and Sn implantation in silicon, J APPL PHYS, 88(3), 2000, pp. 1312-1318