Authors:
Franquet, A
De Laet, J
Schram, T
Terryn, H
Subramanian, V
van Ooij, WJ
Vereecken, J
Citation: A. Franquet et al., Determination of the thickness of thin silane films on aluminium surfaces by means of spectroscopic ellipsometry, THIN SOL FI, 384(1), 2001, pp. 37-45
Authors:
Valova, E
Armyanov, S
Franquet, A
Steenhaut, O
Hubin, A
Vereecken, J
Delplancke, JL
Citation: E. Valova et al., Incorporation of zinc in electroless deposited niclel-phosphorus alloys II. Compositional variations through alloy coating thickness, J ELCHEM SO, 148(4), 2001, pp. C274-C279
Citation: T. Schram et al., Feasibility study to probe thin inorganic and organic coatings on aluminium substrates by means of visible and infrared spectroscopic ellipsometry, SURF INT AN, 30(1), 2000, pp. 507-513