Authors: Busatto, G Fratelli, L Vitale, G

Citation: G. Busatto et al., Reverse bias instabilities in bipolar power transistors with cellular layout, IEEE DEVICE, 48(11), 2001, pp. 2544-2550

Authors: Fratelli, L Cascone, B Giannini, G Busatto, G

Citation: L. Fratelli et al., Long term Reliability Testing of HV-IGBT modules in worst case traction operation, MICROEL REL, 39(6-7), 1999, pp. 1137-1142