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Results: 1-25/27

Authors: da Costa, MEHM Freire, FL Jacobsohn, LG Franceschini, D Mariotto, G Baumvol, IRJ
Citation: Mehm. Da Costa et al., Fluorine incorporation into amorphous hydrogenated carbon films deposited by plasma-enhanced chemical vapor deposition: structural modifications investigated by X-ray photoelectron spectrometry and Raman spectroscopy, DIAM RELAT, 10(3-7), 2001, pp. 910-914

Authors: Freire, FL da Costa, MEHM Jacobsohn, LG Franceschini, DF
Citation: Fl. Freire et al., Film growth and relationship between microstructure and mechanical properties of a-C : H : F films deposited by PECVD, DIAM RELAT, 10(2), 2001, pp. 125-131

Authors: Reigada, DC Freire, FL
Citation: Dc. Reigada et Fl. Freire, Nitrogen incorporation into boron carbide films deposited by dc-magnetron sputtering: film microstructure and tribological properties, SURF COAT, 142, 2001, pp. 889-893

Authors: Jacobsohn, LG Freire, FL
Citation: Lg. Jacobsohn et Fl. Freire, Germanium implantation into amorphous carbon films, NUCL INST B, 175, 2001, pp. 442-447

Authors: Castaneda, SI Espinoza, VAA Freire, FL Franceschini, DF Jacobsohn, LG
Citation: Si. Castaneda et al., Surface modifications in diamond-like carbon films submitted to low-energynitrogen ion bombardment, NUCL INST B, 175, 2001, pp. 699-704

Authors: Freire, FL Reigada, DC Prioli, R
Citation: Fl. Freire et al., Boron carbide and boron-carbon nitride films deposited by DC-magnetron sputtering: Structural characterization and nanotribological properties, PHYS ST S-A, 187(1), 2001, pp. 1-12

Authors: Zanatta, AR Ribeiro, CTM Freire, FL
Citation: Ar. Zanatta et al., Optoelectronic and structural properties of Er-doped sputter-deposited gallium-arsenic-nitrogen films, J APPL PHYS, 90(5), 2001, pp. 2321-2328

Authors: Prioli, R Ponciano, CR Freire, FL
Citation: R. Prioli et al., Nanoscale interaction mechanism between a solid tip and a layered materialwhile in relative motion: the boric acid case, APPL PHYS A, 71(2), 2000, pp. 233-236

Authors: Reigada, DC Prioli, R Jacobsohn, LG Freire, FL
Citation: Dc. Reigada et al., Boron carbide films deposited by a magnetron sputter-ion plating process: film composition and tribological properties, DIAM RELAT, 9(3-6), 2000, pp. 489-493

Authors: Jacobsohn, LG Prioli, R Freire, FL Mariotto, G Lacerda, MM Chung, YW
Citation: Lg. Jacobsohn et al., Comparative study of anneal-induced modifications of amorphous carbon films deposited by dc magnetron sputtering at different argon plasma pressures, DIAM RELAT, 9(3-6), 2000, pp. 680-684

Authors: Lacerda, RG Hammer, P Freire, FL Alvarez, F Marques, FC
Citation: Rg. Lacerda et al., On the structure of argon assisted amorphous carbon films, DIAM RELAT, 9(3-6), 2000, pp. 796-800

Authors: Jacobsohn, LG Franceschini, DF da Costa, MEHM Freire, FL
Citation: Lg. Jacobsohn et al., Structural and mechanical characterization of fluorinated amorphous-carbonfilms deposited by plasma decomposition of CF4-CH4 gas mixtures, J VAC SCI A, 18(5), 2000, pp. 2230-2238

Authors: Freire, FL Jacobsohn, LG Franceschini, DF Camargo, SS
Citation: Fl. Freire et al., Amorphous carbon films deposited by direct current-magnetron sputtering: Void distribution investigated by gas effusion and small angle x-ray scattering experiments, J VAC SCI A, 18(5), 2000, pp. 2344-2348

Authors: Damasceno, JC Camargo, SS Freire, FL Carius, R
Citation: Jc. Damasceno et al., Deposition of Si-DLC films with high hardness, low stress and high deposition rates, SURF COAT, 133, 2000, pp. 247-252

Authors: Zanatta, AR Freire, FL
Citation: Ar. Zanatta et Fl. Freire, Optical study of thermally annealed Er-doped hydrogenated a-Si films, PHYS REV B, 62(3), 2000, pp. 2016-2020

Authors: Freire, FL da Jornada, JAH Camargo, SD
Citation: Fl. Freire et al., Diamond and related materials - Foreword, BRAZ J PHYS, 30(3), 2000, pp. 469-469

Authors: Zanette, SI Caride, AO Nunes, VB Klimchitskaya, GL Freire, FL Prioli, R
Citation: Si. Zanette et al., Theoretical and experimental investigation of the force-distance relation for an atomic force microscope with a pyramidal tip, SURF SCI, 453(1-3), 2000, pp. 75-82

Authors: Prioli, R Reigada, DC Freire, FL
Citation: R. Prioli et al., The role of capillary condensation of water in the nanoscale friction and wear properties of boron carbide films, J APPL PHYS, 88(2), 2000, pp. 679-682

Authors: Prioli, R Reigada, DC Freire, FL
Citation: R. Prioli et al., Nanoscale friction and wear mechanisms at the interface between a boron carbide film and an atomic force microscope tip, J APPL PHYS, 87(3), 2000, pp. 1118-1122

Authors: Wu, ML Guruz, MU Dravid, VP Chung, YW Anders, S Freire, FL Mariotto, G
Citation: Ml. Wu et al., Formation of carbon nitride with sp(3)-bonded carbon in CNx/ZrN superlattice coatings, APPL PHYS L, 76(19), 2000, pp. 2692-2694

Authors: Prioli, R Zanette, SI Caride, AO Lacerda, MM Freire, FL
Citation: R. Prioli et al., Atomic force microscopy investigation of the effects of annealing on amorphous carbon nitride films deposited by r.f. magnetron sputtering, DIAM RELAT, 8(6), 1999, pp. 993-995

Authors: Lacerda, RG Marques, FC Freire, FL
Citation: Rg. Lacerda et al., The subimplantation model for diamond-like carbon films deposited by methane gas decomposition, DIAM RELAT, 8(2-5), 1999, pp. 495-499

Authors: Mariotto, G Vinegoni, C Jacobsohn, LG Freire, FL
Citation: G. Mariotto et al., Raman spectroscopy and scanning electron microscopy investigation of annealed amorphous carbon-germanium films deposited by d.c. magnetron sputtering, DIAM RELAT, 8(2-5), 1999, pp. 668-672

Authors: Lacerda, MM Freire, FL Prioli, R Lepinski, CM Mariotto, G
Citation: Mm. Lacerda et al., Effects of thermal annealing on the microstructure and mechanical properties of carbon-nitrogen films deposited by radio frequency-magnetron sputtering, J VAC SCI A, 17(5), 1999, pp. 2811-2818

Authors: Jacobsohn, LG Freire, FL
Citation: Lg. Jacobsohn et Fl. Freire, Influence of the plasma pressure on the microstructure and on the optical and mechanical properties of amorphous carbon films deposited by direct current magnetron sputtering, J VAC SCI A, 17(5), 1999, pp. 2841-2849
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