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Results: 5
HOW DOES A TIP TAP
Authors:
BURNHAM NA BEHREND OP OULEVEY F GREMAUD G GALLO PJ GOURDON D DUPAS E KULIK AJ POLLOCK HM BRIGGS GAD
Citation:
Na. Burnham et al., HOW DOES A TIP TAP, Nanotechnology, 8(2), 1997, pp. 67-75
ELECTRICAL-CONDUCTIVITY SFM STUDY OF AN ULTRAFILTRATION MEMBRANE
Authors:
GALLO PJ KULIK AJ BURNHAM NA OULEVEY F GREMAUD G
Citation:
Pj. Gallo et al., ELECTRICAL-CONDUCTIVITY SFM STUDY OF AN ULTRAFILTRATION MEMBRANE, Nanotechnology, 8(1), 1997, pp. 10-13
MECHANICAL-PROPERTIES STUDIED AT THE NANOSCALE USING SCANNING LOCAL-ACCELERATION MICROSCOPY (SLAM)
Authors:
OULEVEY F BURNHAM NA KULIK AJ GALLO PJ GREMAUD G BENOIT W
Citation:
F. Oulevey et al., MECHANICAL-PROPERTIES STUDIED AT THE NANOSCALE USING SCANNING LOCAL-ACCELERATION MICROSCOPY (SLAM), Journal de physique. IV, 6(C8), 1996, pp. 731-734
SCANNING LOCAL-ACCELERATION MICROSCOPY
Authors:
BURNHAM NA KULIK AJ GREMAUD G GALLO PJ OULEVEY F
Citation:
Na. Burnham et al., SCANNING LOCAL-ACCELERATION MICROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 794-799
MATERIALS PROPERTIES MEASUREMENTS - CHOOSING THE OPTIMAL SCANNING PROBE MICROSCOPE CONFIGURATION
Authors:
BURNHAM NA GREMAUD G KULIK AJ GALLO PJ OULEVEY F
Citation:
Na. Burnham et al., MATERIALS PROPERTIES MEASUREMENTS - CHOOSING THE OPTIMAL SCANNING PROBE MICROSCOPE CONFIGURATION, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(2), 1996, pp. 1308-1312
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