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Results: 3

Authors: LUKYANCHIKOVA N PETRICHUK M GARBAR N SIMOEN E CLAEYS C
Citation: N. Lukyanchikova et al., RTS NOISE DUE TO LATERAL ISOLATION RELATED DEFECTS IN SUBMICRON NMOSFETS, Microelectronics and reliability, 38(10), 1998, pp. 1561-1568

Authors: LUKYANCHIKOVA P PETRICHUK MV GARBAR N SIMOEN E CLAEYS C
Citation: P. Lukyanchikova et al., IDENTIFICATION OF ISOLATION-EDGE RELATED RANDOM TELEGRAPH SIGNALS IN SUBMICRON SILICON METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTORS, Applied physics letters, 71(26), 1997, pp. 3874-3876

Authors: LUKYANCHIKOVA N PETRICHUK M GARBAR N SIMOEN E CLAEYS C
Citation: N. Lukyanchikova et al., BACK AND FRONT INTERFACE RELATED GENERATION-RECOMBINATION NOISE IN BURIED-CHANNEL SOI PMOSFETS, I.E.E.E. transactions on electron devices, 43(3), 1996, pp. 417-423
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