Authors:
LEE KY
LABIANCA N
RISHTON SA
ZOLGHARNAIN S
GELORME JD
SHAW J
CHANG THP
Citation: Ky. Lee et al., MICROMACHINING APPLICATIONS OF A HIGH-RESOLUTION ULTRATHICK PHOTORESIST, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 13(6), 1995, pp. 3012-3016