Authors: BOGERSHAUSEN W CICCIARELLI R GERCKEN B KRIVAN V MULLERKAFER R PAVEL J SELTNER H SCHELCHER J

Citation: W. Bogershausen et al., PURE GRAPHITE AS A REFERENCE MATERIAL FOR THE DETERMINATION OF TRACE-ELEMENTS - AN INTERLABORATORY COLLABORATIVE STUDY, Fresenius' journal of analytical chemistry, 357(3), 1997, pp. 266-273

Authors: HAUPTKORN S KRIVAN V GERCKEN B PAVEL J

Citation: S. Hauptkorn et al., DETERMINATION OF TRACE IMPURITIES IN HIGH-PURITY QUARTZ BY ELECTROTHERMAL VAPORIZATION INDUCTIVELY-COUPLED PLASMA-MASS SPECTROMETRY USING THE SLURRY SAMPLING TECHNIQUE, Journal of analytical atomic spectrometry, 12(4), 1997, pp. 421-428

Authors: FRANEK M KRIVAN V GERCKEN B PAVEL J

Citation: M. Franek et al., MULTIELEMENT CHARACTERIZATION OF SILICON-NITRIDE POWDERS BY ATOMIC AND MASS-SPECTROMETRIC SOLUTION METHODS, Mikrochimica acta, 113(3-6), 1994, pp. 251-259