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Results: 2

Authors: CRESSWELL MW ALLEN RA GUTHRIE WF SNIEGOWSKI JJ GHOSHTAGORE RN LINHOLM LW
Citation: Mw. Cresswell et al., ELECTRICAL LINEWIDTH TEST STRUCTURES FABRICATED IN MONOCRYSTALLINE FILMS FOR REFERENCE-MATERIAL APPLICATIONS, IEEE transactions on semiconductor manufacturing, 11(2), 1998, pp. 182-193

Authors: CRESSWELL MW SNIEGOWSKI JJ GHOSHTAGORE RN ALLEN RA GUTHRIE WF GURNELL AW LINHOLM LW DIXSON RG TEAGUE EC
Citation: Mw. Cresswell et al., RECENT DEVELOPMENTS IN ELECTRICAL LINEWIDTH AND OVERLAY METROLOGY FORINTEGRATED-CIRCUIT FABRICATION PROCESSES, JPN J A P 1, 35(12B), 1996, pp. 6597-6609
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