Authors: SITTER H GLANNER GJ HERMAN MA

Citation: H. Sitter et al., EXACT DETERMINATION OF THE REAL SUBSTRATE-TEMPERATURE AND FILM THICKNESS IN VACUUM EPITAXIAL-GROWTH SYSTEMS BY VISIBLE LASER INTERFEROMETRY, Vacuum, 46(1), 1995, pp. 69-76

Authors: GLANNER GJ SITTER H FASCHINGER W HERMAN MA

Citation: Gj. Glanner et al., EVALUATION OF GROWTH TEMPERATURE, REFRACTIVE-INDEX, AND LAYER THICKNESS OF THIN ZNTE, MNTE, AND CDTE-FILMS BY IN-SITU VISIBLE LASER INTERFEROMETRY, Applied physics letters, 65(8), 1994, pp. 998-1000