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Authors: HABERMANN T GOHL A NAU D WEDEL M MULLER G CHRIST M SCHRECK M STRITZKER B
Citation: T. Habermann et al., MODIFYING CHEMICAL-VAPOR-DEPOSITED DIAMOND FILMS FOR FIELD-EMISSION DISPLAYS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(2), 1998, pp. 693-696

Authors: GOHL A HABERMANN T MULLER G NAU D WEDEL M CHRIST M SCHRECK M STRITZKER B
Citation: A. Gohl et al., INFLUENCE OF STRUCTURAL AND MORPHOLOGICAL PROPERTIES ON THE INTRINSICFIELD-EMISSION OF CVD DIAMOND FILMS, DIAMOND AND RELATED MATERIALS, 7(2-5), 1998, pp. 666-670

Authors: PUPETER N GOHL A HABERMANN T MAHNER E MULLER G PIEL H NIEDERMANN P HANNI W
Citation: N. Pupeter et al., FIELD-EMISSION MEASUREMENTS WITH MU-M RESOLUTION ON CHEMICAL-VAPOR-DEPOSITED POLYCRYSTALLINE DIAMOND FILMS, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(3), 1996, pp. 2056-2059

Authors: PUPETER N GOHL A HABERMANN T KIRSCHNER A MAHNER E MULLER G PIEL H
Citation: N. Pupeter et al., INFLUENCE OF SURFACE-ROUGHNESS AND PREPARATION, BULK PURITY AND HEAT-TREATMENT ON ELECTRON FIELD-EMISSION FROM NB AND NB3SN, Particle accelerators, 53(1-4), 1996, pp. 77-96
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