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Results: 1
MOSFET PARAMETER DEGRADATION AFTER FOWLER-NORDHEIM INJECTION STRESS
Authors:
CANDELORI A GOMIERO E GHIDINI G PACCAGNELLA A
Citation:
A. Candelori et al., MOSFET PARAMETER DEGRADATION AFTER FOWLER-NORDHEIM INJECTION STRESS, Microelectronics and reliability, 38(2), 1998, pp. 189-193
Risultati:
1-1
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