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Results:
1-7
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Results: 7
Authors:
WHALEY RD
GOPALAN B
DAGENAIS M
GOMEZ RD
JOHNSON FG
AGARWALA S
KING O
STONE DR
Citation: Rd. Whaley et al., USE OF ATOMIC-FORCE MICROSCOPY FOR ANALYSIS OF HIGH-PERFORMANCE INGAASP INP SEMICONDUCTOR-LASERS WITH DRY-ETCHED FACETS/, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1007-1011
Authors:
SUNDAR U
SIVADASAN PC
YADAV RB
GOPALAN B
SYAMSUNDAR S
Citation: U. Sundar et al., RAPID TITRIMETRIC DETERMINATION OF FREE ACIDITY IN-PROCESS SAMPLES OFURANYL-NITRATE, Analyst (London. 1877. Print), 123(9), 1998, pp. 1875-1877
Authors:
KRISHNA GR
RAVINDRA HR
GOPALAN B
SYAMSUNDAR S
Citation: Gr. Krishna et al., QUANTITATIVE-DETERMINATION OF TRI-N-BUTYL PHOSPHATE BY FLUORESCENT X-RAY SPECTROMETRY THROUGH INORGANIC ASSOCIATION WITH AN ACTINIDE, Journal of radioanalytical and nuclear chemistry, 204(2), 1996, pp. 295-302
Authors:
RAO YB
YADAV RB
SWAMY RN
GOPALAN B
SYAMSUNDAR S
Citation: Yb. Rao et al., DETERMINATION OF SPECIFIC SURFACE-AREA OF URANIUM OXIDE POWDERS USINGDIFFERENTIAL THERMAL-ANALYSIS TECHNIQUE, Journal of thermal analysis, 44(6), 1995, pp. 1439-1448
Authors:
KRISHNA GR
RAVINDRA HR
GOPALAN B
SYAMSUNDER S
Citation: Gr. Krishna et al., DETERMINATION OF IRON IN NUCLEAR GRADE ZIRCONIUM-OXIDE BY X-RAY-FLUORESCENCE SPECTROMETRY USING AN INTERNAL INTENSITY REFERENCE, Analytica chimica acta, 309(1-3), 1995, pp. 333-338
Authors:
KRISHNA GR
RAVINDRA HR
GOPALAN B
SYAMSUNDAR S
Citation: Gr. Krishna et al., APPLICATION OF A WAVELENGTH DISPERSIVE-X-RAY FLUORESCENCE SPECTROMETRIC TECHNIQUE FOR THE ANALYSIS OF TANTALUM IN TITANIUM TANTALUM ALLOYS, Analytica chimica acta, 299(2), 1994, pp. 285-290
Authors:
RAVINDRA HR
RADHAKRISHNA G
GOPALAN B
SYAMSUNDAR S
Citation: Hr. Ravindra et al., DETERMINATION OF TELLURIUM IN SELENIUM BY WAVELENGTH DISPERSIVE-X-RAYFLUORESCENCE SPECTROMETRY, Analyst, 118(12), 1993, pp. 1559-1561
Risultati:
1-7
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