Authors:
GOSSET LG
GANEM JJ
TRIMAILLE I
RIGO S
ROCHET F
DUFOUR G
JOLLY F
STEDILE FC
BAUMVOL IJR
Citation: Lg. Gosset et al., HIGH-RESOLUTION DEPTH PROFILING IN SILICON OXYNITRIDE FILMS USING NARROW NUCLEAR-REACTION RESONANCES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 521-527
Authors:
AMSEL G
DARTEMARE E
BATTISTIG G
GIRARD E
GOSSET LG
REVESZ P
Citation: G. Amsel et al., NARROW NUCLEAR-RESONANCE POSITION OR CROSS-SECTION SHAPE MEASUREMENTSWITH A HIGH-PRECISION COMPUTER-CONTROLLED BEAM ENERGY SCANNING SYSTEM, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 545-550
Authors:
BAUMVOL IJR
GANEM JJ
GOSSET LG
TRIMAILLE I
RIGO S
Citation: Ijr. Baumvol et al., INCORPORATION OF OXYGEN AND NITROGEN IN ULTRATHIN FILMS OF SIO2 ANNEALED IN NO, Applied physics letters, 72(23), 1998, pp. 2999-3001