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Authors: GOSSET LG GANEM JJ TRIMAILLE I RIGO S ROCHET F DUFOUR G JOLLY F STEDILE FC BAUMVOL IJR
Citation: Lg. Gosset et al., HIGH-RESOLUTION DEPTH PROFILING IN SILICON OXYNITRIDE FILMS USING NARROW NUCLEAR-REACTION RESONANCES, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 521-527

Authors: AMSEL G DARTEMARE E BATTISTIG G GIRARD E GOSSET LG REVESZ P
Citation: G. Amsel et al., NARROW NUCLEAR-RESONANCE POSITION OR CROSS-SECTION SHAPE MEASUREMENTSWITH A HIGH-PRECISION COMPUTER-CONTROLLED BEAM ENERGY SCANNING SYSTEM, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 138, 1998, pp. 545-550

Authors: BAUMVOL IJR GANEM JJ GOSSET LG TRIMAILLE I RIGO S
Citation: Ijr. Baumvol et al., INCORPORATION OF OXYGEN AND NITROGEN IN ULTRATHIN FILMS OF SIO2 ANNEALED IN NO, Applied physics letters, 72(23), 1998, pp. 2999-3001
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