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Authors: BIDEUX L ROBERT C MERLE S GRUZZA B GOUMET E GILLAFON E
Citation: L. Bideux et al., SOME APPLICATIONS OF ELASTIC PEAK ELECTRON-SPECTROSCOPY FOR SEMICONDUCTOR SURFACE STUDIES, Surface and interface analysis, 26(12), 1998, pp. 903-907

Authors: TRASSOUDAINE A PARILLAUD O GOUMET E CASTELLUCI D GILLAFON E CADORET R
Citation: A. Trassoudaine et al., KINETIC-STUDY OF SI INCORPORATION IN INP BY THE HYDRIDE VAPOR-PHASE EPITAXY, Journal of crystal growth, 192(3-4), 1998, pp. 402-409
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