Authors: UKRAINTSEV VA MCGLOTHLIN R GRIBELYUK MA EDWARDS H

Citation: Va. Ukraintsev et al., STRONG EFFECT OF DOPANT CONCENTRATION GRADIENT AN ETCHING RATE, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(1), 1998, pp. 476-480

Authors: KITTL JA HONG QZ YANG H YU N SAMAVEDAM SB GRIBELYUK MA

Citation: Ja. Kittl et al., ADVANCED SALICIDES FOR 0.10 MU-M CMOS - CO SALICIDE PROCESSES WITH LOW DIODE LEAKAGE AND TI SALICIDE PROCESSES WITH DIRECT FORMATION OF LOW-RESISTIVITY C54 TISI2, Thin solid films, 332(1-2), 1998, pp. 404-411

Authors: KITTL JA GRIBELYUK MA SAMAVEDAM SB

Citation: Ja. Kittl et al., MECHANISM OF LOW-TEMPERATURE C54 TISI2 FORMATION BYPASSING C49 TISI2 - EFFECT OF SI MICROSTRUCTURE AND MO IMPURITIES ON THE TI-SI REACTION-PATH, Applied physics letters, 73(7), 1998, pp. 900-902

Authors: GRIBELYUK MA HARRIS PJF HUTCHISON JL

Citation: Ma. Gribelyuk et al., PLAN-VIEW AND PROFILE IMAGING OF SULFIDED PLATINUM PARTICLES, Philosophical magazine. B. Physics of condensed matter. Structural, electronic, optical and magnetic properties, 69(4), 1994, pp. 655-669

Authors: GRIBELYUK MA COWLEY JM

Citation: Ma. Gribelyuk et Jm. Cowley, DETERMINATION OF EXPERIMENTAL IMAGING CONDITIONS FOR OFF-AXIS TRANSMISSION ELECTRON HOLOGRAPHY, Ultramicroscopy, 50(1), 1993, pp. 29-40