Authors: GROCHOWSKI A BHATTACHARYA D VISWANATHAN TR LAKER K

Citation: A. Grochowski et al., INTEGRATED-CIRCUIT TESTING FOR QUALITY ASSURANCE IN MANUFACTURING - HISTORY, CURRENT STATUS, AND FUTURE-TRENDS, IEEE transactions on circuits and systems. 2, Analog and digital signal processing, 44(8), 1997, pp. 610-633