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Authors: DELEONIBUS S MARTIN F HEITZMANN M GUIBERT JC PAPON AM
Citation: S. Deleonibus et al., ELIMINATION OF STRESS-INDUCED DEFECTS IN POLYBUFFERED LOCOS ISOLATIONSCHEME FOR SUB-0.25-MU-M DESIGNS, Journal of the Electrochemical Society, 144(6), 1997, pp. 164-166

Authors: DELEONIBUS S HEITZMANN M GOBIL Y MARTIN F DEMOLLIENS O GUIBERT JC TOFFOLI A
Citation: S. Deleonibus et al., DIFFERENTIAL BODY EFFECT ANALYSIS AND OPTIMIZATION OF THE LARGE TILT IMPLANTED SLOPED SHALLOW TRENCH ISOLATION PROCESS (LATI-STI), JPN J A P 2, 35(8A), 1996, pp. 971-973
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