Authors:
MEYER E
HOWALD L
LUTHI R
HAEFKE H
RUETSCHI M
BONNER T
OVERNEY R
FROMMER J
HOFER R
GUNTHEROIDT HJ
Citation: E. Meyer et al., SCANNING PROBE MICROSCOPY ON THE SURFACE OF SI(111), Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 2060-2063