Authors: MEYER E HOWALD L LUTHI R HAEFKE H RUETSCHI M BONNER T OVERNEY R FROMMER J HOFER R GUNTHEROIDT HJ

Citation: E. Meyer et al., SCANNING PROBE MICROSCOPY ON THE SURFACE OF SI(111), Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 12(3), 1994, pp. 2060-2063