Authors: Gagnard, X Rey-Tauriac, Y Bonnaud, O

Citation: X. Gagnard et al., Polysilicon oxide quality optimization at wafer level of a Bipolar/CMOS/DMOS technology, MICROEL REL, 41(9-10), 2001, pp. 1335-1340

Authors: Gagnard, X Taurin, M Bonnaud, O

Citation: X. Gagnard et al., New rapid method for lifetime determination of gate oxide validated with Bipolar/CMOS/DMOS technology, MICROEL REL, 39(6-7), 1999, pp. 759-763