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Results: 1
Self-timed boundary-scan cells for multi-chip module test
Authors:
Garcia, TA Acosta, AJ Mora, JM Ramos, J Huertas, JL
Citation:
Ta. Garcia et al., Self-timed boundary-scan cells for multi-chip module test, J ELEC TEST, 15(1-2), 1999, pp. 115-127
Risultati:
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