Authors: Gartsman, K Cahen, D Scheer, R

Citation: K. Gartsman et al., Electric field-induced junctions in epitaxial layers of CuInSe2, APPL PHYS L, 79(18), 2001, pp. 2919-2921

Authors: Lubomirsky, I Wang, TY Gartsman, K Stafsudd, OM

Citation: I. Lubomirsky et al., Principle of low-energy electron beam-induced current imaging for ferroelectric thin films, ADVAN MATER, 12(2), 2000, pp. 91-94

Authors: Golan, G Rabinovich, E Inberg, A Oksman, M Rancoita, PG Rattaggi, M Gartsman, K Seidman, A Croitoru, N

Citation: G. Golan et al., Atomic force microscopy investigation of dislocation structures and deformation characteristics in neutron-irradiated silicon detectors, MICROELEC J, 31(11-12), 2000, pp. 937-944

Authors: Lyahovitskaya, V Richter, S Frolow, F Kaplan, L Manassen, Y Gartsman, K Cahen, D

Citation: V. Lyahovitskaya et al., Growth of single CuInSe2 crystals by the traveling heater method and theircharacterization, J CRYST GR, 197(1-2), 1999, pp. 177-185