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Results: 1-9 |
Results: 9
Raman scattering study of gallium nitride heavily doped with manganese
Authors: Gebicki, W Adamowicz, L Strzeszewski, J Podsiadlo, S Szyszko, T Kamler, G
Citation: W. Gebicki et al., Raman scattering study of gallium nitride heavily doped with manganese, MAT SCI E B, 82(1-3), 2001, pp. 182-184
Growth of bulk Ga1-xMnxN single crystals
Authors: Szyszko, T Kamler, G Strojek, B Weisbrod, G Podsiadlo, S Adamowicz, L Gebicki, W Szczytko, J Twardowski, A Sikorski, K
Citation: T. Szyszko et al., Growth of bulk Ga1-xMnxN single crystals, J CRYST GR, 233(4), 2001, pp. 631-638
Magnetic and optical properties of GaMnN magnetic semiconductor
Authors: Zajac, M Doradzinski, R Gosk, J Szczytko, J Lefeld-Sosnowska, M Kaminska, M Twardowski, A Palczewska, M Grzanka, E Gebicki, W
Citation: M. Zajac et al., Magnetic and optical properties of GaMnN magnetic semiconductor, APPL PHYS L, 78(9), 2001, pp. 1276-1278
The influence of erbium on the physical properties of GaN crystals grown from N solution in Ga at high nitrogen pressure
Authors: Teisseyre, H Ochalski, TJ Perlin, P Suski, T Leszczynski, M Grzegory, I Bockowski, M Lucznik, B Bugajski, M Palczewska, M Gebicki, W
Citation: H. Teisseyre et al., The influence of erbium on the physical properties of GaN crystals grown from N solution in Ga at high nitrogen pressure, HIGH PR RES, 18(1-6), 2000, pp. 35-39
Bulk GaN single-crystals growth
Authors: Kamler, G Zachara, J Podsiadlo, S Adamowicz, L Gebicki, W
Citation: G. Kamler et al., Bulk GaN single-crystals growth, J CRYST GR, 212(1-2), 2000, pp. 39-48
Raman scattering study of Ga1-xMnxN crystals
Authors: Gebicki, W Strzeszewski, J Kamler, G Szyszko, T Podsiadlo, S
Citation: W. Gebicki et al., Raman scattering study of Ga1-xMnxN crystals, APPL PHYS L, 76(26), 2000, pp. 3870-3872
The role of residual stresses in layered composites of Y-ZrO2 and Al2O3
Authors: Tomaszewski, H Strzeszewski, J Gebicki, W
Citation: H. Tomaszewski et al., The role of residual stresses in layered composites of Y-ZrO2 and Al2O3, J EUR CERAM, 19(2), 1999, pp. 255-262
Relaxation dispersion of ionic conductivity of BICOVOX
Authors: Kezionis, A Bogusz, W Krok, F Dygas, J Orliukas, A Abrahams, I Gebicki, W
Citation: A. Kezionis et al., Relaxation dispersion of ionic conductivity of BICOVOX, SOL ST ION, 119(1-4), 1999, pp. 145-150
Structure of alumina oxide coatings deposited by impulse plasma method
Authors: Zdunek, K Mizera, J Wiencek, P Gebicki, W Mozdzonek, M
Citation: K. Zdunek et al., Structure of alumina oxide coatings deposited by impulse plasma method, THIN SOL FI, 344, 1999, pp. 324-327
Risultati: 1-9 |