Authors:
Weiss, C
Knoth, J
Schwenke, H
Geisler, H
Lerche, J
Schulz, R
Ullrich, HJ
Citation: C. Weiss et al., Potential of total reflection and grazing incidence XRF for contamination and process control in semiconductor fabrication, MIKROCH ACT, 133(1-4), 2000, pp. 65-68
Authors:
Geisler, H
Schweitz, KO
Chevallier, J
Bottiger, J
Samwer, K
Citation: H. Geisler et al., Hardness enhancement and elastic modulus behaviour in sputtered Ag/Ni multilayers with different modulation wavelengths, PHIL MAG A, 79(2), 1999, pp. 485-500
Citation: U. Herr et al., Polymorphic crystallization of interface stabilized amorphous Fe-Zr thin films under variable driving force, PHYS REV B, 59(21), 1999, pp. 13719-13727