Authors: Nufer, S Gemming, T Elsasser, C Kostlmeier, S Ruhle, M

Citation: S. Nufer et al., Core-hole effect in the ELNES of alpha-Al2O3: experiment and theory, ULTRAMICROS, 86(3-4), 2001, pp. 339-342

Authors: Nufer, S Marinopoulos, AG Gemming, T Elsasser, C Kurtz, W Kostlmeier, S Ruhle, M

Citation: S. Nufer et al., Quantitative atomic-scale analysis of interface structures: Transmission electron microscopy and local density functional theory, PHYS REV L, 86(22), 2001, pp. 5066-5069

Authors: Akatsu, T Scheu, C Wagner, T Gemming, T Hosoda, N Suga, T Ruhle, M

Citation: T. Akatsu et al., Morphology and microstructure of the Ar+-ion sputtered (0001) alpha-Al2O3 surface, APPL SURF S, 165(2-3), 2000, pp. 159-165

Authors: Polli, AD Wagner, T Gemming, T Ruhle, M

Citation: Ad. Polli et al., Growth of platinum on TiO2- and SrO-terminated SrTiO3(100), SURF SCI, 448(2-3), 2000, pp. 279-289

Authors: Strecker, A Mayer, J Baretzky, B Eigenthaler, U Gemming, T Schweinfest, R Ruhle, M

Citation: A. Strecker et al., Optimization of TEM specimen preparation by double-sided ion beam thinningunder low angles, J ELEC MICR, 48(3), 1999, pp. 235-244