Authors:
Georgobiani, AN
Gruzintsev, AN
Vorob'ev, MO
Kaiser, U
Richter, W
Khodos, II
Citation: An. Georgobiani et al., Fine structure of the edge ultraviolet luminescence of GaN : Mg films activated in a nitrogen plasma and the electroluminescence of a ZnO-GaN : Mg heterostructure based on these films, SEMICONDUCT, 35(6), 2001, pp. 695-699
Authors:
Georgobiani, AN
Gruzintsev, AN
Aminov, UA
Vorob'ev, MO
Khodos, II
Citation: An. Georgobiani et al., The edge ultraviolet luminescence of GaN : Zn films activated in a nitrogen plasma, SEMICONDUCT, 35(2), 2001, pp. 144-148
Authors:
Agafonov, EN
Aminov, UA
Georgobiani, AN
Lepnev, LS
Citation: En. Agafonov et al., Observation of minority-carrier traps in Schottky diodes with a high barrier and a compensated near-contact region using deep-level transient spectroscopy, SEMICONDUCT, 35(1), 2001, pp. 48-53
Authors:
Georgobiani, AN
Kotlyarevsky, MB
Rogozin, IV
Citation: An. Georgobiani et al., Phase content and photoluminescence of ZnO layers obtained on ZnSe substrates by radical beam gettering epitaxy, NUCL PH B-P, 78, 1999, pp. 484-487
Authors:
Georgobiani, AN
Aminov, UA
Dravin, VA
Lepnev, LS
Mullabaev, ID
Ursaki, VV
Iljukhina, ZP
Citation: An. Georgobiani et al., Luminescence and electrophysical characteristics of ZnSe implanted with acceptor impurities, NUCL INST A, 426(1), 1999, pp. 164-168