Authors: Gerli, A Keiser, BA Surya, PI

Citation: A. Gerli et al., The use of focused beam reflectance measurement in the development of a new nanosize particle, APPITA J, 54(1), 2001, pp. 36-40

Authors: Gerli, A Berkhout, S

Citation: A. Gerli et S. Berkhout, Improvement of quality of printing papers obtained through implementation of a new microparticle retention and drainage program, PAP PUU, 83(7), 2001, pp. 532-537

Authors: Clemencon, I Gerli, A

Citation: I. Clemencon et A. Gerli, The effect of flocculant/microparticles retention programs on floc properties, NORD PULP P, 14(1), 1999, pp. 23-29

Authors: Alfano, JC Carter, PW Gerli, A

Citation: Jc. Alfano et al., Characterization of the flocculation dynamics in a papermaking system by non-imaging reflectance scanning laser microscopy (SLM), NORD PULP P, 13(2), 1998, pp. 159-165