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Results: 1-7 |
Results: 7
Dynamics of one-dimensional domain walls interacting with disorder potential
Authors: Krusin-Elbaum, L Shibauchi, T Argyle, B Gignac, L Zabel, T Weller, D
Citation: L. Krusin-elbaum et al., Dynamics of one-dimensional domain walls interacting with disorder potential, J MAGN MAGN, 226, 2001, pp. 1317-1318
High coercivity of ultra-high-density ordered Co nanorod arrays
Authors: Shibauchi, T Krusin-Elbaum, L Gignac, L Black, CT Thurn-Albrecht, T Russell, TP Schotter, J Kastle, GA Emley, N Tuominen, MT
Citation: T. Shibauchi et al., High coercivity of ultra-high-density ordered Co nanorod arrays, J MAGN MAGN, 226, 2001, pp. 1553-1554
Stable ultrahigh-density magnetooptical recordings using introduced lineardefects
Authors: Krusin-Elbaum, L Shibauchi, T Argyle, B Gignac, L Weller, D
Citation: L. Krusin-elbaum et al., Stable ultrahigh-density magnetooptical recordings using introduced lineardefects, NATURE, 410(6827), 2001, pp. 444-446
High-quality aluminum oxide gate dielectrics by ultra-high-vacuum reactiveatomic-beam deposition
Authors: Guha, S Cartier, E Bojarczuk, NA Bruley, J Gignac, L Karasinski, J
Citation: S. Guha et al., High-quality aluminum oxide gate dielectrics by ultra-high-vacuum reactiveatomic-beam deposition, J APPL PHYS, 90(1), 2001, pp. 512-514
Mechanisms for very long electromigration lifetime in dual-damascene Cu interconnections
Authors: Hu, CK Gignac, L Malhotra, SG Rosenberg, R Boettcher, S
Citation: Ck. Hu et al., Mechanisms for very long electromigration lifetime in dual-damascene Cu interconnections, APPL PHYS L, 78(7), 2001, pp. 904-906
Mechanisms for microstructure evolution in electroplated copper thin filmsnear room temperature
Authors: Harper, JME Cabral, C Andricacos, PC Gignac, L Noyan, IC Rodbell, KP Hu, CK
Citation: Jme. Harper et al., Mechanisms for microstructure evolution in electroplated copper thin filmsnear room temperature, J APPL PHYS, 86(5), 1999, pp. 2516-2525
Dual damascene aluminum for 1-Gbit DRAMs
Authors: Iggulden, R Clevenger, L Costrini, G Dobuzinsky, D Filippi, R Gambino, J Lin, CT Schnabel, F Weber, S Gignac, L Ronay, M
Citation: R. Iggulden et al., Dual damascene aluminum for 1-Gbit DRAMs, SOL ST TECH, 41(11), 1998, pp. 37
Risultati: 1-7 |