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Results: 1-3 |
Results: 3
Latchup characterization of 0.18-micron STI cobalt silicided test structures
Authors: Goh, WL Yeo, KS Lazuardi, S Peng, W Leong, KC Chan, L See, A
Citation: Wl. Goh et al., Latchup characterization of 0.18-micron STI cobalt silicided test structures, MICROELEC J, 32(9), 2001, pp. 725-731
A neural network workbench for teaching and learning
Authors: Goh, WL Amarasinghe, SK
Citation: Wl. Goh et Sk. Amarasinghe, A neural network workbench for teaching and learning, STUD FUZZ S, 36, 2000, pp. 289-309
The manufacture and performance of diodes made in dielectrically isolated silicon substrates containing buried metallic layers
Authors: Goh, WL Raza, SH Montgomery, JH Armstrong, BM Gamble, HS
Citation: Wl. Goh et al., The manufacture and performance of diodes made in dielectrically isolated silicon substrates containing buried metallic layers, IEEE ELEC D, 20(5), 1999, pp. 212-214
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