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Results: 2
Near-field scanning microwave probe based on a dielectric resonator
Authors:
Abu-Teir, M Golosovsky, M Davidov, D Frenkel, A Goldberger, H
Citation:
M. Abu-teir et al., Near-field scanning microwave probe based on a dielectric resonator, REV SCI INS, 72(4), 2001, pp. 2073-2079
High-frequency eddy-current technique for thickness measurement of micron-thick conducting layers
Authors:
Sakran, F Golosovsky, M Goldberger, H Davidov, D Frenkel, A
Citation:
F. Sakran et al., High-frequency eddy-current technique for thickness measurement of micron-thick conducting layers, APPL PHYS L, 78(11), 2001, pp. 1634-1636
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