Authors: Lysenko, VS Tyagulskii, IP Osiyuk, IN Nazarov, AN Vovk, YN Gomenyuk, YV Terukov, EI Kon'kov, OI

Citation: Vs. Lysenko et al., Effect of erbium on electronic traps in PECVD-grown a-Si : H(Er)/c-Si structures, SEMICONDUCT, 35(6), 2001, pp. 621-626