Authors:
Foix, D
Gonbeau, D
Taillades, G
Pradel, A
Ribes, M
Citation: D. Foix et al., The structure of ionically conductive chalcogenide glasses: a combined NMR, XPS and ab initio calculation study, SOLID ST SC, 3(1-2), 2001, pp. 235-243
Authors:
Martin-Litas, I
Vinatier, P
Levasseur, A
Dupin, JC
Gonbeau, D
Citation: I. Martin-litas et al., Promising thin films (WO1.05S2 and WO1.35S2.2) as positive electrode materials in microbatteries, J POWER SOU, 97-8, 2001, pp. 545-547
Authors:
Dupin, JC
Gonbeau, D
Martin-Litas, I
Vinatier, P
Levasseur, A
Citation: Jc. Dupin et al., Lithium intercalation/deintercalation in transition metal oxides investigated by X-ray photoelectron spectroscopy, J ELEC SPEC, 120(1-3), 2001, pp. 55-65
Authors:
Dupin, JC
Gonbeau, D
Benqlilou-Moudden, H
Vinatier, P
Levasseur, A
Citation: Jc. Dupin et al., XPS analysis of new lithium cobalt oxide thin-films before and after lithium deintercalation, THIN SOL FI, 384(1), 2001, pp. 23-32
Citation: D. Gonbeau et al., XPS study of stilbazolium chromophores and their intercalation compounds in the MnPS3 layered phase, J PHYS CH B, 103(18), 1999, pp. 3545-3551
Citation: A. Levasseur et al., X-ray photoelectron spectroscopy: A powerful tool for a better characterization of thin film materials, B MATER SCI, 22(3), 1999, pp. 607-614
Authors:
Martinez, H
Auriel, C
Gonbeau, D
Pfister-Guillouzo, G
Meerschaut, A
Citation: H. Martinez et al., Electronic structure of two misfit layer compounds: (PbS)(1.18)(TiS2) and (PbS)(1.18)(TiS2)(2), J ELEC SPEC, 95(2-3), 1998, pp. 145-158