Authors: Vlasenko, LS Gorelenok, AT Emtsev, VV Kamanin, AV Kokhanovskii, SI Poloskin, DS Shmidt, NM

Citation: Ls. Vlasenko et al., Diagnostics of high-resistivity GaAs wafers by microwave photoconductivity, TECH PHYS L, 27(1), 2001, pp. 9-10

Authors: Vlasenko, LS Gorelenok, AT Emtsev, VV Kamanin, AV Poloskin, DS Shmidt, NM

Citation: Ls. Vlasenko et al., Surface gettering of background impurities and defects in GaAs wafers, SEMICONDUCT, 35(2), 2001, pp. 177-180