Authors:
Hessler-Wyser, A
Cuenat, A
Dobeli, M
Abromeit, C
Gotthardt, R
Citation: A. Hessler-wyser et al., Multilayered phase formation after high-fluence implantation of nickel into aluminium, PHIL MAG L, 81(12), 2001, pp. 893-899
Citation: Ds. Grummon et R. Gotthardt, Latent strain in titanium-nickel thin films modified by irradiation of theplastically-deformed martensite phase with 5 MeV Ni2+, ACT MATER, 48(3), 2000, pp. 635-646
Authors:
Lehnert, T
Grimmer, H
Boni, P
Horisberger, M
Gotthardt, R
Citation: T. Lehnert et al., Characterization of shape-memory alloy thin films made up from sputter-deposited Ni/Ti multilayers, ACT MATER, 48(16), 2000, pp. 4065-4071
Authors:
Cuenat, A
Schaublin, R
Hessler-Wyser, A
Gotthardt, R
Citation: A. Cuenat et al., Structure analysis by diffraction of amorphous zones created by Ni ion implantation into pure Al, ULTRAMICROS, 83(3-4), 2000, pp. 179-191
Authors:
Kolomytsev, V
Nevdacha, V
Bataillard, L
Gotthardt, R
Citation: V. Kolomytsev et al., Critical exponents of the transport properties at the B2 double left rightarrow IC double left right arrow C(R) transitions in Ti-Ni-Me shape memoryalloys, INT J MOD B, 14(17), 2000, pp. 1729-1742
Authors:
Crevoiserat, S
Scherrer, P
Dimitropoulos, C
Gotthardt, R
Citation: S. Crevoiserat et al., Study of the martensitic phase transformation in Ni-Ti by nuclear magneticresonance, MAT SCI E A, 275, 1999, pp. 357-361
Authors:
Bellouard, Y
Lehnert, T
Bidaux, JE
Sidler, T
Clavel, R
Gotthardt, R
Citation: Y. Bellouard et al., Local annealing of complex mechanical devices: a new approach for developing monolithic micro-devices, MAT SCI E A, 275, 1999, pp. 795-798
Authors:
Cuenat, A
Schaublin, R
Hessler-Wyser, A
Gotthardt, R
Citation: A. Cuenat et al., Stability of Al0.75Ni0.25 amorphous zones induced by Ni ion implantation into pure aluminium, NUCL INST B, 146(1-4), 1998, pp. 238-243