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Results: 1-25/32
Authors:
Gross, N
Dazzi, A
Ortega, JM
Andouart, R
Prazeres, R
Chicanne, C
Goudonnet, JP
Lacroute, Y
Boussard, C
Fonteneau, G
Hocde, S
Citation: N. Gross et al., Infrared near-field study of a localised absorption in a thin film, EPJ-APPL PH, 16(2), 2001, pp. 91-98
Authors:
Lesko, S
Lesniewska, E
Nonat, A
Mutin, JC
Goudonnet, JP
Citation: S. Lesko et al., Investigation by atomic force microscopy of forces at the origin of cementcohesion, ULTRAMICROS, 86(1-2), 2001, pp. 11-21
Authors:
Finot, E
Thundat, T
Lesniewska, E
Goudonnet, JP
Citation: E. Finot et al., Measuring magnetic susceptibilities of nanogram quantities of materials using microcantilevers, ULTRAMICROS, 86(1-2), 2001, pp. 175-180
Authors:
Finot, E
Lesniewska, E
Goudonnet, JP
Mutin, JC
Domenech, M
Kadi, AA
Citation: E. Finot et al., Correlating surface forces with surface reactivity of gypsum crystals by atomic force microscopy. Comparison with theological properties of plaster, SOL ST ION, 141, 2001, pp. 39-46
Authors:
Weeber, JC
Krenn, JR
Dereux, A
Lamprecht, B
Lacroute, Y
Goudonnet, JP
Citation: Jc. Weeber et al., Near-field observation of surface plasmon polariton propagation on thin metal stripes - art. no. 045411, PHYS REV B, 6404(4), 2001, pp. 5411
Authors:
Dawson, P
Puygranier, BAF
Goudonnet, JP
Citation: P. Dawson et al., Surface plasmon polariton propagation length: A direct comparison using photon scanning tunneling microscopy and attenuated total reflection - art. no. 205410, PHYS REV B, 6320(20), 2001, pp. 5410
Authors:
Puygranier, BAF
Dawson, P
Lacroute, Y
Goudonnet, JP
Citation: Baf. Puygranier et al., Surface plasmon polariton propagation across a gentle silver step, SURF SCI, 490(1-2), 2001, pp. 85-98
Authors:
Fabre, A
Finot, E
Demoment, J
Contreras, S
Goudonnet, JP
Citation: A. Fabre et al., Microscale technique for in situ measurement of elastic parameters of materials under reactive atmosphere, REV SCI INS, 72(10), 2001, pp. 3914-3920
Authors:
Dereux, A
Devaux, E
Weeber, JC
Goudonnet, JP
Girard, C
Citation: A. Dereux et al., Direct interpretation of near-field optical images, J MICROSC O, 202, 2001, pp. 320-331
Authors:
Krenn, JR
Salerno, M
Felidj, N
Lamprecht, B
Schider, G
Leitner, A
Aussenegg, FR
Weeber, JC
Dereux, A
Goudonnet, JP
Citation: Jr. Krenn et al., Light field propagation by metal micro- and nanostructures, J MICROSC O, 202, 2001, pp. 122-128
Authors:
Richard, N
Dereux, A
Goudonnet, JP
Scheurer, F
Beaurepaire, E
Beauvillain, P
Citation: N. Richard et al., Optimized factor of merit of the magneto-optical Kerr effect of ferromagnetic thin films, EUR PHY J B, 14(3), 2000, pp. 419-422
Authors:
Weeber, JC
Dereux, A
Girard, C
des Francs, GC
Krenn, JR
Goudonnet, JP
Citation: Jc. Weeber et al., Optical addressing at the subwavelength scale, PHYS REV E, 62(5), 2000, pp. 7381-7388
Authors:
Giocondi, MC
Vie, V
Lesniewska, E
Goudonnet, JP
Le Grimellec, C
Citation: Mc. Giocondi et al., In situ imaging of detergent-resistant membranes by atomic force microscopy, J STRUCT B, 131(1), 2000, pp. 38-43
Authors:
Finot, E
Lesniewska, E
Mutin, JC
Goudonnet, JP
Citation: E. Finot et al., Investigations of surface forces between gypsum microcrystals in air usingatomic force microscopy, LANGMUIR, 16(9), 2000, pp. 4237-4244
Authors:
Chicanne, C
Emonin, S
Richard, N
David, T
Bourillot, E
Goudonnet, JP
Lacroute, Y
Citation: C. Chicanne et al., Characterization of optogeometric parameters of optical fibers by near-field scanning probe microscopies, J OPT SOC B, 17(9), 2000, pp. 1473-1482
Authors:
Vie, V
Giocondi, MC
Lesniewska, E
Finot, E
Goudonnet, JP
Le Grimellec, C
Citation: V. Vie et al., Tapping-mode atomic force microscopy on intact cells: optimal adjustment of tapping conditions by using the deflection signal, ULTRAMICROS, 82(1-4), 2000, pp. 279-288
Authors:
Devaux, E
Dereux, A
Bourillot, E
Weeber, JC
Lacroute, Y
Goudonnet, JP
Girard, C
Citation: E. Devaux et al., Detection of the optical magnetic field by circular symmetry plasmons, APPL SURF S, 164, 2000, pp. 124-130
Authors:
Finot, E
Lesniewska, E
Goudonnet, JP
Mutin, JC
Citation: E. Finot et al., Correlation between surface forces and surface reactivity in the setting of plaster by atomic force microscopy, APPL SURF S, 161(3-4), 2000, pp. 316-322
Authors:
Devaux, E
Dereux, A
Bourillot, E
Weeber, JC
Lacroute, Y
Goudonnet, JP
Girard, C
Citation: E. Devaux et al., Local detection of the optical magnetic field in the near zone of dielectric samples, PHYS REV B, 62(15), 2000, pp. 10504-10514
Authors:
Tsilimbaris, MK
Lesniewska, E
Lydataki, S
Le Grimellec, C
Goudonnet, JP
Pallikaris, IG
Citation: Mk. Tsilimbaris et al., The use of atomic force microscopy for the observation of corneal epithelium surface, INV OPHTH V, 41(3), 2000, pp. 680-686
Authors:
Crevecoeur, M
Lesniewska, E
Vie, V
Goudonnet, JP
Greppin, H
Le Grimellec, C
Citation: M. Crevecoeur et al., Atomic-force microscopy imaging of plasma membranes purified from spinach leaves, PROTOPLASMA, 212(1-2), 2000, pp. 46-55
Authors:
Richard, N
Dereux, A
Bourillot, E
David, T
Goudonnet, JP
Scheurer, F
Beaurepaire, E
Citation: N. Richard et al., Near-field zone analysis of the Faraday rotation of magneto-optical thin films, J APPL PHYS, 88(5), 2000, pp. 2541-2547
Authors:
Krenn, JR
Weeber, JC
Dereux, A
Bourillot, E
Goudonnet, JP
Schider, B
Leitner, A
Aussenegg, FR
Girard, C
Citation: Jr. Krenn et al., Direct observation of localized surface plasmon coupling, PHYS REV B, 60(7), 1999, pp. 5029-5033
Authors:
Weeber, JC
Dereux, A
Girard, C
Krenn, JR
Goudonnet, JP
Citation: Jc. Weeber et al., Plasmon polaritons of metallic nanowires for controlling submicron propagation of light, PHYS REV B, 60(12), 1999, pp. 9061-9068
Authors:
Richard, N
Dereux, A
David, T
Bourillot, E
Goudonnet, JP
Scheurer, F
Beaurepaire, E
Garreau, G
Citation: N. Richard et al., Magneto-optical effects in multilayers illuminated by total internal reflection, PHYS REV B, 59(8), 1999, pp. 5936-5944