Authors:
Gritsch, M
Piplits, K
Barbist, R
Wilhartitz, P
Hutter, H
Citation: M. Gritsch et al., SIMS analysis of the oxidation behaviour of SiFeCr coated technical refractory metal alloys, MATER CORRO, 52(7), 2001, pp. 501-508
Citation: M. Gritsch et al., Effect of crossflows on the discharge coefficient of film cooling holes with varying angles of inclination and orientation, J TURBOMACH, 123(4), 2001, pp. 781-787
Authors:
Gritsch, M
Kosina, H
Grasser, T
Selberherr, S
Citation: M. Gritsch et al., Influence of generation/recombination effects in simulations of partially depleted SOI MOSFETs, SOL ST ELEC, 45(4), 2001, pp. 621-627
Authors:
Constantinides, I
Gritsch, M
Adriaens, A
Hutter, H
Adams, F
Citation: I. Constantinides et al., Microstructural characterisation of five simulated archaeological copper alloys using light microscopy, scanning electron microscopy, energy dispersive X-ray microanalysis and secondary ion mass spectrometry, ANALYT CHIM, 440(2), 2001, pp. 189-198
Authors:
Ai, XT
Hutter, H
Gritsch, M
Borner, H
Sunderkotter, JD
Bubert, H
Jenett, H
Citation: Xt. Ai et al., Al and Ti secondary neutral and secondary ion emission from oxide samples in the high-frequency sputtering mode of HF-plasma SNMS, FRESEN J AN, 366(1), 2000, pp. 41-47
Authors:
Gritsch, M
Saumweber, C
Schulz, A
Wittig, S
Sharp, E
Citation: M. Gritsch et al., Effect of internal coolant crossflow orientation on the discharge coefficient of shaped film-cooling holes, J TURBOMACH, 122(1), 2000, pp. 146-152
Authors:
Gritsch, M
Piplits, K
Hutter, H
Wilhartitz, P
Wildner, H
Martinz, HP
Citation: M. Gritsch et al., Investigations on the oxidation behavior of technical molybdenum foils by means of secondary-ion mass spectrometry, SURF SCI, 454, 2000, pp. 284-288
Authors:
Gritsch, M
Brunner, C
Piplits, K
Hutter, H
Wilhartitz, P
Schintlmeister, A
Martinz, HP
Citation: M. Gritsch et al., Application of scanning SIMS techniques for the evaluation of the oxidation behavior of high-purity molybdenum, FRESEN J AN, 365(1-3), 1999, pp. 188-194