Authors:
Shiojima, K
Woodall, JM
Eiting, CJ
Grudowski, PA
Dupuis, RD
Citation: K. Shiojima et al., Effect of defect density on the electrical characteristics of n-type GaN Schottky contacts, J VAC SCI B, 17(5), 1999, pp. 2030-2033
Authors:
Shiojima, K
McInturff, DT
Woodall, JM
Grudowski, PA
Eiting, CJ
Dupuis, RD
Citation: K. Shiojima et al., Electrical characteristics and thermal stability of W, WSiN, and Nb contacts to p- and n-type GaN, J ELEC MAT, 28(3), 1999, pp. 228-233
Authors:
Dupuis, RD
Park, J
Grudowski, PA
Eiting, CJ
Liliental-Weber, Z
Citation: Rd. Dupuis et al., Selective-area and lateral epitaxial overgrowth of III-N materials by metalorganic chemical vapor deposition, J CRYST GR, 195(1-4), 1998, pp. 340-345