Authors:
Jiang, ZX
Backer, S
Lee, JJ
Wu, LY
Guenther, T
Sieloff, D
Choi, P
Foisy, M
Alkemade, PFA
Citation: Zx. Jiang et al., Approach to the characterization of through-oxide boron implantation by secondary ion mass spectrometry, J VAC SCI B, 19(4), 2001, pp. 1133-1137
Authors:
Emiliani, V
Guenther, T
Lienau, C
Notzel, R
Ploog, KH
Citation: V. Emiliani et al., Femtosecond near-field spectroscopy: carrier relaxation and transport in single quantum wires, J MICROSC O, 202, 2001, pp. 229-240
Authors:
Guenther, T
Malyarchuk, V
Tomm, JW
Muller, R
Lienau, C
Luft, J
Citation: T. Guenther et al., Near-field photocurrent imaging of the optical mode profiles of semiconductor laser diodes, APPL PHYS L, 78(11), 2001, pp. 1463-1465
Authors:
Emiliani, V
Guenther, T
Lienau, C
Notzel, R
Ploog, KH
Citation: V. Emiliani et al., Ultrafast near-field spectroscopy of quasi-one-dimensional transport in a single quantum wire, PHYS REV B, 61(16), 2000, pp. 10583-10586
Authors:
Amano, M
Marui, M
Guenther, T
Ohizumi, H
Miyazaki, N
Citation: M. Amano et al., Re-evaluation of geographic variation in the white flank patch of Dalli-type Dall's porpoises, MAR MAMM SC, 16(3), 2000, pp. 631-636