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Citation: Vp. Popov et al., Properties of extremely thin silicon layer in silicon-on-insulator structure formed by smart-cut technology, MAT SCI E B, 73(1-3), 2000, pp. 82-86
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Citation: Ak. Gutakovskii et al., Influence of the step height of the vicinal surface of germanium on the formation of antiphase boundaries in a gallium-arsenide-germanium-gallium-arsenide(001) system, TECH PHYS L, 24(12), 1998, pp. 949-951
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Kachurin, GA
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