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Results:
1-11
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Results: 11
Authors:
NIEMCZYK TM
ZHANG LZ
HAALAND DM
RADIGAN KJ
Citation: Tm. Niemczyk et al., QUANTITATIVE-DETERMINATION OF DIELECTRIC THIN-FILM PROPERTIES ON PRODUCT WAFERS USING INFRARED REFLECTION-ABSORPTION SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 16(6), 1998, pp. 3490-3494
Authors:
ZHANG S
FRANKE JE
NIEMCZYK TM
HAALAND DM
COX JN
BANERJEE I
Citation: S. Zhang et al., TESTING OF A RAPID FAULT-DETECTION MODEL FOR QUALITY-CONTROL - BOROPHOSPHOSILICATE GLASS THIN-FILMS MONITORED BY INFRARED-ABSORPTION SPECTROSCOPY, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 15(4), 1997, pp. 955-960
Authors:
HAALAND DM
JONES HDT
THOMAS EV
Citation: Dm. Haaland et al., MULTIVARIATE CLASSIFICATION OF THE INFRARED-SPECTRA OF CELL AND TISSUE SAMPLES, Applied spectroscopy, 51(3), 1997, pp. 340-345
Authors:
ZHANG LZ
FRANKE JE
NIEMCZYK TM
HAALAND DM
Citation: Lz. Zhang et al., OPTIMIZED EXTERNAL IR REFLECTION SPECTROSCOPY FOR QUANTITATIVE-DETERMINATION OF BOROPHOSPHOSILICATE GLASS PARAMETERS, Applied spectroscopy, 51(2), 1997, pp. 259-264
Authors:
FRANKE JE
ZHANG LZ
NIEMCZYK TM
HAALAND DM
RADIGAN KJ
Citation: Je. Franke et al., QUANTITATIVE-ANALYSIS OF BOROPHOSPHOSILICATE GLASS-FILMS ON SILICON USING INFRARED EXTERNAL REFLECTION-ABSORPTION SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(4), 1995, pp. 1959-1966
Authors:
NAQVI SSH
KRUKAR RH
MCNEIL JR
FRANKE JE
NIEMCZYK TM
HAALAND DM
GOTTSCHO RA
KORNBLIT A
Citation: Ssh. Naqvi et al., ETCH DEPTH ESTIMATION OF LARGE-PERIOD SILICON GRATINGS WITH MULTIVARIATE CALIBRATION OF RIGOROUSLY SIMULATED DIFFRACTION PROFILES, Journal of the Optical Society of America. A, Optics, image science,and vision., 11(9), 1994, pp. 2485-2493
Authors:
NIEMCZYK TM
WANGMANEERAT B
HAALAND DM
Citation: Tm. Niemczyk et al., PRECISE PROPERTY DETERMINATIONS OF ARSENOSILICATE GLASS THIN-FILMS USING INFRARED-SPECTROSCOPY, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 12(3), 1994, pp. 835-838
Authors:
FRANKE JE
NIEMCZYK TM
HAALAND DM
Citation: Je. Franke et al., INFRARED SPECTROSCOPIC TECHNIQUES FOR QUANTITATIVE CHARACTERIZATION OF DIELECTRIC THIN-FILMS ON SILICON-WAFERS, Spectrochimica acta. Part A: Molecular spectroscopy, 50(10), 1994, pp. 1687-1723
Authors:
HAALAND DM
Citation: Dm. Haaland, FASTER FT-IR ANALYSIS - OMNIC, Analytical chemistry, 66(20), 1994, pp. 10001021-10001022
Authors:
FRANKE JE
ZHANG L
NIEMCZYK TM
HAALAND DM
LINN JH
Citation: Je. Franke et al., QUANTITATIVE-ANALYSIS OF INFRARED REFLECTION SPECTRA FROM PHOSPHOSILICATE GLASS-FILMS, Journal of the Electrochemical Society, 140(5), 1993, pp. 1425-1429
Authors:
HAALAND DM
THOMAS EV
BLAIR DS
Citation: Dm. Haaland et al., IMPROVEMENTS IN METHODS FOR SPECTRAL COMBINATION OF GAS-CHROMATOGRAPHY FOURIER-TRANSFORM INFRARED SPECTROSCOPIC DATA, Applied spectroscopy, 47(10), 1993, pp. 1612-1619
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