Authors:
HADAD D
CHEN TS
BALU V
JIANG B
KUAH SH
MCINTYRE P
SUMMERFELT S
ANTHONY JM
LEE JC
Citation: D. Hadad et al., THE EFFECTS OF FORMING GAS ANNEAL ON THE ELECTRICAL CHARACTERISTICS OF IR-ELECTRODED BST THIN-FILM CAPACITORS, Integrated ferroelectrics, 17(1-4), 1997, pp. 461-469