Authors: HAGMANN DR HUMMEL RE

Citation: Dr. Hagmann et Re. Hummel, CHARACTERIZATION OF MULTILAYER THIN-FILM STRUCTURES BY DIFFERENTIAL REFLECTION SPECTROSCOPY, Materials research bulletin, 31(12), 1996, pp. 1449-1461

Authors: HUMMEL RE FENG SW HAGMANN DR

Citation: Re. Hummel et al., ON THE INITIAL ANNEALING STAGE OF AS+ IMPLANTED SILICON, Zeitschrift fur Metallkunde, 84(5), 1993, pp. 320-323