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Results: 1-10 |
Results: 10
REAL-TIME IN-SITU COMPOSITION CONTROL OF INGAAS LATTICE-MATCHED TO INP BY AN 88-WAVELENGTH ELLIPSOMETER
Authors: KUO CH BOONZAAYER M DEHERRERA M KYONG T ZHANG YH JOHS B HALE JS
Citation: Ch. Kuo et al., REAL-TIME IN-SITU COMPOSITION CONTROL OF INGAAS LATTICE-MATCHED TO INP BY AN 88-WAVELENGTH ELLIPSOMETER, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 16(3), 1998, pp. 1484-1488
VISIBLE AND INFRARED OPTICAL-CONSTANTS OF ELECTROCHROMIC MATERIALS FOR EMISSIVITY MODULATION APPLICATIONS
Authors: HALE JS DEVRIES M DWORAK B WOOLLAM JA
Citation: Js. Hale et al., VISIBLE AND INFRARED OPTICAL-CONSTANTS OF ELECTROCHROMIC MATERIALS FOR EMISSIVITY MODULATION APPLICATIONS, Thin solid films, 313, 1998, pp. 205-209
MICROSTRUCTURAL CHARACTERIZATION OF SIOX SURFACE CONTAMINANTS ON ASHED ALUMINUM THIN-FILMS
Authors: SYNOWICKI RA HALE JS KUBIK RD NAFIS S WOOLLAM JA
Citation: Ra. Synowicki et al., MICROSTRUCTURAL CHARACTERIZATION OF SIOX SURFACE CONTAMINANTS ON ASHED ALUMINUM THIN-FILMS, Surface & coatings technology, 90(1-2), 1997, pp. 150-155
OXYGEN PLASMA ASHER CONTAMINATION - AN ANALYSIS OF SOURCES AND REMEDIES
Authors: SYNOWICKI RA HALE JS MCGAHAN WA IANNO NJ WOOLLAM JA
Citation: Ra. Synowicki et al., OXYGEN PLASMA ASHER CONTAMINATION - AN ANALYSIS OF SOURCES AND REMEDIES, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 14(6), 1996, pp. 3075-3081
IN-SITU ELLIPSOMETRIC CHARACTERIZATION OF THE ELECTRODEPOSITION OF METAL-FILMS
Authors: HILFIKER JN THOMPSON DW HALE JS WOOLLAM JA
Citation: Jn. Hilfiker et al., IN-SITU ELLIPSOMETRIC CHARACTERIZATION OF THE ELECTRODEPOSITION OF METAL-FILMS, Thin solid films, 270(1-2), 1995, pp. 73-77
LOW-EARTH-ORBIT EXPOSURE OF CARBON-BASED MATERIALS ABOARD SHUTTLE FLIGHT STS-46
Authors: SPADY BR SYNOWICKI RA HALE JS DEVRIES MJ WOOLLAM JA MOORE AW LAKE M
Citation: Br. Spady et al., LOW-EARTH-ORBIT EXPOSURE OF CARBON-BASED MATERIALS ABOARD SHUTTLE FLIGHT STS-46, Journal of spacecraft and rockets, 32(6), 1995, pp. 1015-1017
THIN-FILM MATERIALS EXPOSURE TO LOW-EARTH-ORBIT ABOARD SPACE-SHUTTLE
Authors: SYNOWICKI RA HALE JS SPADY B REISER M NAFIS S WOOLLAM JA
Citation: Ra. Synowicki et al., THIN-FILM MATERIALS EXPOSURE TO LOW-EARTH-ORBIT ABOARD SPACE-SHUTTLE, Journal of spacecraft and rockets, 32(1), 1995, pp. 97-102
DEGRADATION OF THIN-FILMS - COMPARISON BETWEEN LOW-EARTH-ORBIT EXPERIMENTS AND LABORATORY SIMULATIONS OF THE SPACE ENVIRONMENT
Authors: WOOLLAM JA SYNOWICKI RA HALE JS IANNO NJ SPADY BL MOORE AW HAMBOURGER P
Citation: Ja. Woollam et al., DEGRADATION OF THIN-FILMS - COMPARISON BETWEEN LOW-EARTH-ORBIT EXPERIMENTS AND LABORATORY SIMULATIONS OF THE SPACE ENVIRONMENT, Thin solid films, 241(1-2), 1994, pp. 218-221
LOW-EARTH-ORBIT EFFECTS ON INDIUM TIN OXIDE AND POLYESTER AND COMPARISON WITH LABORATORY SIMULATIONS
Authors: SYNOWICKI RA HALE JS IANNO NJ WOOLLAM JA HAMBOURGER PD
Citation: Ra. Synowicki et al., LOW-EARTH-ORBIT EFFECTS ON INDIUM TIN OXIDE AND POLYESTER AND COMPARISON WITH LABORATORY SIMULATIONS, Surface & coatings technology, 62(1-3), 1993, pp. 499-503
LOW-EARTH-ORBIT SIMULATION AND MATERIALS CHARACTERIZATION (VOL 30, PG116, 1993)
Authors: SYNOWICKI RA HALE JS WOOLLAM JA
Citation: Ra. Synowicki et al., LOW-EARTH-ORBIT SIMULATION AND MATERIALS CHARACTERIZATION (VOL 30, PG116, 1993), Journal of spacecraft and rockets, 30(6), 1993, pp. 788-788
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