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Results: 1-7 |
Results: 7
LOW-TEMPERATURE GROWTH OF HIGHLY CRYSTALLIZED SILICON THIN-FILMS USING HYDROGEN AND ARGON DILUTION
Authors: HAMMA S CABARROCAS PRI
Citation: S. Hamma et Pri. Cabarrocas, LOW-TEMPERATURE GROWTH OF HIGHLY CRYSTALLIZED SILICON THIN-FILMS USING HYDROGEN AND ARGON DILUTION, Journal of non-crystalline solids, 230, 1998, pp. 852-856
NANOPARTICLE FORMATION IN LOW-PRESSURE SILANE PLASMAS - BRIDGING THE GAP BETWEEN A-SI-H AND MU-C-SI FILMS
Authors: CABARROCAS PRI HAMMA S SHARMA SN VIERA G BERTRAN E COSTA J
Citation: Pri. Cabarrocas et al., NANOPARTICLE FORMATION IN LOW-PRESSURE SILANE PLASMAS - BRIDGING THE GAP BETWEEN A-SI-H AND MU-C-SI FILMS, Journal of non-crystalline solids, 230, 1998, pp. 871-875
PROPERTIES OF A NEW A-SI-H-LIKE MATERIAL - HYDROGENATED POLYMORPHOUS SILICON
Authors: LONGEAUD C KLEIDER JP CABARROCAS PRI HAMMA S MEAUDRE R MEAUDRE M
Citation: C. Longeaud et al., PROPERTIES OF A NEW A-SI-H-LIKE MATERIAL - HYDROGENATED POLYMORPHOUS SILICON, Journal of non-crystalline solids, 230, 1998, pp. 96-99
METASTABILITY STUDIES IN SILICON THIN-FILMS - FROM SHORT-RANGE ORDERED TO MEDIUM AND LONG-RANGE ORDERED MATERIALS
Authors: STAHEL P HAMMA S SLADEK P CABARROCAS PRI
Citation: P. Stahel et al., METASTABILITY STUDIES IN SILICON THIN-FILMS - FROM SHORT-RANGE ORDERED TO MEDIUM AND LONG-RANGE ORDERED MATERIALS, Journal of non-crystalline solids, 230, 1998, pp. 276-280
LONG-RANGE EFFECTS OF HYDROGEN DURING MICROCRYSTALLINE SILICON GROWTH
Authors: HAMMA S CABARROCAS PRI
Citation: S. Hamma et Pri. Cabarrocas, LONG-RANGE EFFECTS OF HYDROGEN DURING MICROCRYSTALLINE SILICON GROWTH, Thin solid films, 296(1-2), 1997, pp. 11-14
IN-SITU CORRELATION BETWEEN THE OPTICAL AND ELECTRICAL-PROPERTIES OF THIN INTRINSIC AND N-TYPE MICROCRYSTALLINE SILICON FILMS
Authors: HAMMA S CABARROCAS PRI
Citation: S. Hamma et Pri. Cabarrocas, IN-SITU CORRELATION BETWEEN THE OPTICAL AND ELECTRICAL-PROPERTIES OF THIN INTRINSIC AND N-TYPE MICROCRYSTALLINE SILICON FILMS, Journal of applied physics, 81(11), 1997, pp. 7282-7288
NEW FEATURES OF THE LAYER-BY-LAYER DEPOSITION OF MICROCRYSTALLINE SILICON FILMS REVEALED BY SPECTROSCOPIC ELLIPSOMETRY AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
Authors: CABARROCAS PRI HAMMA S HADJADJ A BERTOMEU J ANDREU J
Citation: Pri. Cabarrocas et al., NEW FEATURES OF THE LAYER-BY-LAYER DEPOSITION OF MICROCRYSTALLINE SILICON FILMS REVEALED BY SPECTROSCOPIC ELLIPSOMETRY AND HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY, Applied physics letters, 69(4), 1996, pp. 529-531
Risultati: 1-7 |