Authors:
BENSON TE
KAMLET LI
RUEGSEGGER SM
HANISH CK
HANISH PD
RASHAP BA
KLIMECKY P
FREUDENBERG JS
GRIZZLE JW
KHARGONEKAR PP
TERRY FL
BARNEY B
Citation: Te. Benson et al., SENSOR SYSTEMS FOR REAL-TIME FEEDBACK-CONTROL OF REACTIVE ION ETCHING, Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement and phenomena, 14(1), 1996, pp. 483-488
Citation: Pd. Hanish et al., A MODEL-BASED TECHNIQUE FOR REAL-TIME ESTIMATION OF ABSOLUTE FLUORINECONCENTRATION IN A CF4 AR PLASMA/, Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13(3), 1995, pp. 1802-1807