Authors: HANKLA BJ WILLIAMS PF

Citation: Bj. Hankla et Pf. Williams, SCHLIEREN PHOTOGRAPHY OF CURRENT FILAMENTS IN SURFACE-RELATED BREAKDOWN OF SILICON, IEEE transactions on plasma science, 24(1), 1996, pp. 67-68

Authors: YI WJ HANKLA BJ WILLIAMS PF

Citation: Wj. Yi et al., HIGH-TEMPORAL-RESOLUTION, HIGH-SENSITIVITY IMAGING OF STREAMERS IN A LONG ATMOSPHERIC-PRESSURE GAP, IEEE transactions on plasma science, 24(1), 1996, pp. 93-94

Authors: HANKLA BJ WILLIAMS PF FRECKS GA PETERKIN FE

Citation: Bj. Hankla et al., SURFACE-RELATED BREAKDOWN IN SILICON - IMAGING OF CURRENT FILAMENTS IN LONG P(-N(-)-N(+) STRUCTURES()), Applied physics letters, 67(26), 1995, pp. 3942-3944

Authors: PETERKIN FE WILLIAMS PF HANKLA BJ BURESH LL WOODWARD SA

Citation: Fe. Peterkin et al., INHIBITION OF SURFACE-RELATED ELECTRICAL BREAKDOWN OF LONG P-I-N+ SILICON STRUCTURES(), Applied physics letters, 62(18), 1993, pp. 2236-2238