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Results:
1-8
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Results: 8
Authors:
HARTING M
Citation: M. Harting, A SEMINUMERICAL METHOD TO DETERMINE THE DEPTH PROFILE OF THE 3-DIMENSIONAL RESIDUAL-STRESS STATE WITH X-RAY-DIFFRACTION, Acta materialia, 46(4), 1998, pp. 1427-1436
Authors:
BRITTON DT
HARTING M
TEEMANE MRB
MILLS S
NORTIER FM
VANDERWALT TN
Citation: Dt. Britton et al., A SOUTHERN AFRICAN POSITRON BEAM, Applied surface science, 116, 1997, pp. 53-58
Authors:
BRITTON DT
HARTING M
Citation: Dt. Britton et M. Harting, EPITHERMAL POSITRON DYNAMICS, Applied surface science, 116, 1997, pp. 162-167
Authors:
HARTING M
FRITSCH G
Citation: M. Harting et G. Fritsch, DETERMINATION OF THE RESIDUAL-STRESS STATE IN A NATURAL TITANIUM-OXIDE LAYER, Acta materialia, 44(2), 1996, pp. 487-492
Authors:
HARTING M
WILLUTZKI P
Citation: M. Harting et P. Willutzki, A NEW METHOD TO POSITION A SAMPLE ON A ROTATING AXIS ACCURATELY, Measurement science & technology, 6(3), 1995, pp. 276-280
Authors:
UHLMANN K
HARTING M
BRITTON DT
Citation: K. Uhlmann et al., CHARACTERIZATION OF TITANIUM NITRIDE LAYERS BY POSITRON-ANNIHILATION AND X-RAY-DIFFRACTION, Journal of physics. Condensed matter, 6(15), 1994, pp. 2943-2948
Authors:
HABERKERN R
FRITSCH G
HARTING M
Citation: R. Haberkern et al., SEMIMETALLIC BEHAVIOR OF I-ALCUFE QUASI-CRYSTALS, Applied physics. A, Solids and surfaces, 57(5), 1993, pp. 431-435
Authors:
HARTING M
FRITSCH G
Citation: M. Harting et G. Fritsch, A NONDESTRUCTIVE METHOD TO DETERMINE THE DEPTH-DEPENDENCE OF 3-DIMENSIONAL RESIDUAL-STRESS STATES BY X-RAY-DIFFRACTION, Journal of physics. D, Applied physics, 26(10), 1993, pp. 1814-1816
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1-8
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